WebOPTOTHERM Sentris 热发射显微镜系统作为一台专业为缺陷定位的系统,专为电子产品FA设计,通过特别的LOCK-IN技术,使用LWIR镜头,仍能将将温度分辨率提升 … WebThe Sentris thermal imaging microscope pinpoints the low-level infrared thermal emissions by IC faults such as short circuits and leakage current. Using a non-destructive testing …
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WebThe Sentris thermal imaging microscope pinpoints the low-level infrared thermal emissions by IC faults such as short circuits and leakage current. Using a non-destructive testing (NDT) process called lock-in thermography, failures can be isolated on both bare (front or backside) and packaged devices and no surface coating is required. WebDownload scientific diagram a) shows the proposed meander line nanoantenna absorber consisting of the top gold meander line nanoantenna with a highly resistive dielectric spacer layer and a gold ... can energy be imprinted upon